Atomic Force Miscroscope

Atomic force micrscope (AFM) is an industrial and scientific instrumentation for 3D scanning of nano-meter sized objects. In my first job, I worked as a systems engineer for a couple years at Park Systems to design controllers for the stage and actuators which are used in these devices. Nothing really works as cleanly at this small scale, so a lot of attention is put into system characterization, noise-supression and decoupling of multi-axes actuators.